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- Virginia Panel Corporation
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Tool, Extraction, 50 Ohm Coax & Power Surface
910112112
Tool, Extraction, 50 Ohm Coax & Power Surface
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Ocean Observer III
Teledyne Marine RD Instruments
Since 1997 Teledyne RD Instruments has been providing ADCPs that have proven in the field they can profile beyond 1000 m from research vessels traveling at speeds >15 knots and from offshore oil and gas platforms during exploration work. That same technology has now allowed us to create the Ocean Observer III 38 kHz ADCP. We have combined our field-proven 38 kHz phased array ADCP transducer with our field-proven electronics into a single package that is capable of profiling >1000m. This design makes it ideal to be mounted from an oil platform, over the side of a vessel, and in surface buoys.
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XPS/ESCA Service
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Process RF Analyzer
IMPS-4400
The Sensortech Instant Moisture Profiling System (IMPS-4400) is a non-contact RF moisture profiling system for board manufacturers to improve and optimize production processes and meet quality standards, reduce energy costs, increase productivity, and generate revenue. The IMPS-4400 utilizes radio frequency antennas to analyze board moisture characteristics below the surface, which is critical information to ensure consistent quality of finished boards.
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3D Optical Surface Profiler
NewView™ 9000
The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.
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Sub-bottom Profiling
The EdgeTech Sub-bottom Profiling System is a wideband Frequency Modulated (FM) sub-bottom profiler utilizing EdgeTech’s proprietary Full Spectrum CHIRP technology. The systems generate high-resolution images of the sub-bottom stratigraphy in oceans, lakes, and rivers.
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Surface Profile
Surface profile: The degree of profile on the surface affects a coating’s overall performance and determines aspects such as adhesion, coverage and overall volume of coatings used. If the profile is too large the amount of coating required increases, otherwise there is a danger that the peaks remain uncoated - allowing rust spots to occur. If the profile is too small there may be an insufficient key for adequate adhesion.
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Beam Profiling
The beam propagation factor M2 is a common single parameter that charac-terizes the whole beam as it propagates through space. According to ISO standard 11146, this parameter could be defined by several measurement techniques based on beam profiling along several points of the propagating beam. The standard defines several measurement techniques, all of which are based on beam profiling measurements using devices such as cam-eras, knife edge and slits. There are two main measurement requierments - 1) Measurements of focused beams. 2) Measurements of collimated beams. Our M2 devices are capable of measurements of both laser types and due to their modular design interchangeable heads can be mounted in same M2 gear.
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Plasma Profiling TOFMS
PP-TOFMS
Plasma Profiling TOFMS addresses the needs of materials scientists across a wide range of application areas. PP-TOFMS provides fast elemental depth distribution of any inorganic material. The speed and ease of use of PP-TOFMS permit to reduce optimization time of growth processes as many research scientists strive to reduce the time from discovery to applications of new materials.The simultaneous full coverage of TOFMS available for each point of depth permits the detection of non suspected contamination. This is key for failure analysis and optimization of thin film processes that tend to no longer be based on ultra-high grade methods (i.e. ink jet printing…).
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Scanning Slit Beam Profiling
NanoScan
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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Multibeam Profiling Module
MB-2250
The BlueView 2250 multibeam profiling module, built for the Gavia AUV by Teledyne BlueView, is derived from the company’s proven 2250 kHz MBSeries sonar. Teledyne BlueView is recognized as the leading manufacturer of integrated Multibeam Profiling sonar systems for high resolution data collection.
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Profiling Systems
ICK profiling systems measure, detect, classify, count, and check vehicles in 3D. They determine the number of axles on heavy goods trucks for vehicle classification and measure vehicle dimensions to rectify loading errors. The systems recognize overheated vehicles approaching tunnels and other entrances and activate diversions. They also monitor external train contours. If a limit value is exceeded, the system triggers an alarm. All this contributes to safety on roads and railroads.
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Surface Analysis
Dimension AFP
The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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Surface Comparators & Magnifier
127
Designed for use with the Elcometer 127 illuminated magnifier, each surface comparator has a hole in the centre allowing for clear visual comparisons to be made.
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Surface Thickness Gauges
The Cygnus range of ultrasonic surface thickness gauges are non-destructive testing (NDT) instruments that enable an accurate metal thickness measurement to be obtained from one side only, without the removal of protective coatings or damage to test materials.
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Entry Level Beam Profiling
BeamMic®
BeamMic is simplified set of measurement tools for the entry level beam analysis user. The camera-based beam profiling system consists of a camera and analysis software. Often times, this system will need to be used with beam attenuation or beam sizing accessories, depending on your laser application. BeamMic includes a complete set of high-accuracy measurements, and features a rich graphical interface. For the laser technician, this entry-level software will easily help you quickly become familiar with the many benefits of beam profiling.
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Multibeam Profiling Software
MB-DataLogger
Teledyne BlueView's MB-DataLogger software provides a powerful tool for multibeam profiling applications. From mission setup to data playback, review, and export, MB-DataLogger gives users full end-to-end mission support. Set up data collection parameters (sonar head range, ping rate, filename identifiers, etc.) for a SmartCore-enabled system prior to deployment, then review bathymetric profiles in a 2D or 3D waterfall display with or without navigation correction post mission. When regions of interest are identified, export batches of data files to georeferenced point clouds to be imported by third-party applications. MB-DataLogger is the software Swiss army knife for your BlueView multibeam profiling system.
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Surface Roughness
Surface Roughness: these consist of a stylus attached to an arm which moves over the surface to record and measure the roughness over a specified distance, recording peak-to-valley average.
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Surface Roughness Testers
Widely used in production site to measure surface roughness of various machinery-processed parts, calculate corresponding parameters according to selected measuring conditions and clearly display all measurement parameters.
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Surface Contamination Kit
138/2
The Elcometer 138/2 Surface Contamination Kit provides the user with a means for testing invisible surface contaminants including:pHchloride ionsironsalts
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Surface Contamination Monitor
IMI Inspector Alert™ V2
The IMI Inspector Alert™ V2 measures alpha, beta, gamma and x-radiation using a 2-inch “pancake” GM detector with high sensitivity to common beta and alpha sources. The easy-to-read digital display shows readings in your choice of µSv/hr, mR/hr, CPM, or CPS. The Total/Timer feature allows timed readings from one minute to 40 hours for precise measurement of low level contamination. An audible alert sounds when the radiation reaches a user-adjustable level.
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Surface Resistance Meter
990SRM
The Model 990SRM is a convenient, pocket-sized meter for measurement of surface resistivity and resistance to ground.
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Surface Resistance Meter
Model 152-1
The Trek Model 152-1 Surface Resistance Meter is designed to measure surface resistance on a wide varieties of conductive, dissipative, and insulative materials. The Model 152-1 employs a measurement technique which conforms to several ANSI/ESD Association standards for measuring surface resistance and surface resistivity including ANSI/ESD-STM2.1 for garments, STM4.1 for work surfaces, STM7.1 for flooring,
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Thermal Profiling System
lt is impossible to have dependable production without quality management. The expectation is growing and customers requirements must be addressed. In most of the industries, proper monitoring of temperature with time plays an important role in the quality of products. Whether it can be painted/powder coating industries, oven manufactures, automobile industries, and many more.
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Color Calibration & Profiling
For both amateurs and professionals photographers, filmmakers, designers, premedia and printing operators achieving predictable results from capture to output can be a challenge. Color Perfectionists turn to X-Rite for affordable, professional, quality calibrating and profiling solutions that make sure all of your devices monitors, projectors, cameras, scanners, printers and mobile devices are speaking the same language.
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ElcoMaster Oven Profiling Software
*Oven Logger set up & programming*Paint/Powder parameter library*Product probe maps*Fully customisable inspection templates*Selectable probe/channel traces*Statistical analysis by probe/channel*Max, Min, standard deviation, coefficient of variation*Temperature profile, cure progress, histogram & individual cure value graphs against product*Time at temperature, time of peak difference*Time above maximum absolute & minimum cross link temperatures*Fully customisable inspection reports*Combined reports - coating thickness, gloss, adhesion, profile, climate, surface cleanliness*Report generator wizard & PDF generator*Email or export data*Import photo’s, data sheets, critical data, inspection notes, etc & include on inspection reports*Cloud computing - allows for cross site collaboration, including internal text messaging tool*Overlay temperature profiles, review and compare multiple oven profiles over time*Use additional data loggers for multiple channels or run overlays
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Large Surface Defect Gauge
4D InSpec® XL Surface Defect Gauge
The 4D InSpec XL Surface Defect Gauge expands 4D Technology’s 4D InSpec product line—they’re the first handheld, precision instruments for 3D non-contact surface defect measurement.
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Surface Form Analysis System
Tropel® FlatMaster®
Tropel® FlatMaster® Surface Form Analysis System Fast and Precise Measurements of Ground, Lapped, Honed, Polished and Super-finished Components. The Tropel® FlatMaster® offers industry leading performance for surface form measurements to precision component manufacturers. Our non-contact optical technique analyzes the entire surface of the part in seconds, regardless of its size or complexity. The FlatMaster provides five nanometer resolution and a standard accuracy of 50 nm (2.0 μ). It rapidly and accurately measures flatness, line profile, radius and other surface parameters on a variety of materials and surface finishes.
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Surface Insulation Resistivity Tester
Model SRT1
The model SRT1 is an advanced instrument for measuring surface insulation resistivity following ASTM standard A717 (IEC 404-11). Featuring the improved, patented Allegheny Ludlum Head*, which providesincreased reliability and repeatability while decreasing maintenance costs. Its floating baseplate assures button alignment across the full sample width and length.
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Surface Resistivity Meter
395
The ACL 395 handheld meter features sophisticated circuitry that allows for the same advantages as megohmmeters, but at an economical price. Utilizing color-coded zones, the LED scale is easy to read and evaluate. Half decades indicate where the measurement value falls within the decade giving a closer indication to actual value. Unlike other pocket-sized meters, the ACL 395 features rubber rails which provide the best possible contact.
