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Particle
fundamental objects of quanta.
See Also: Nanoparticle, Airborne Particle, Particle Accelerator, Particle Counters, Particle Detection, Wave
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Alpha Particle Counting System
UltraLo-1800
The UltraLo-1800 is a best-in-class alpha particle counting system. Our patented design reduces background rates by 50x compared to conventional systems.
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NTA Particle Size Analyzers
NanoSight Range
The Malvern Panalytical NanoSight range of instruments utilizes Nanoparticle Tracking Analysis (NTA) to characterize nanoparticles from 10nm -2000nm* in solution. Each particle is individually but simultaneously analyzed by direct observation and measurement of diffusion events. This particle-by-particle methodology produces high resolution results for nanoparticle size distribution and concentration, while visual validation provides users with additional confidence in their data. Both particle size and concentration are measured, while a fluorescence mode provides differentiation of intrinsic or fluorescently labelled nanoparticles.
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Engine Exhaust Particle Counters
Researchers and vehicle manufacturers around the world use TSI engine emissions particle counters for certification testing, emission research, and in-use diesel particulate filter (DPF) performance checks.
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Particle Image Velocimetry (PIV)
Particle Image Velocimetry (PIV) is a non-intrusive laser optical measurement technique for research and diagnostics into flow, turbulence, microfluidics, spray atomization, and combustion processes.
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0.1 Micron Portable Particle Counter
3950
This revolutionary 0.1-0.3 micron 2-channel semiconductor particle counter comes in one of the lightest form-factors available today; clocking in at only 7.5lbs (3.4kg). It is designed for high-end contamination control environments, such as semiconductor manufacturing facilities and cleanrooms, and can be used for standalone operation or integrated into an existing monitoring system to accommodate a vast array of applications.
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Semiconductor Inspection (SEMI)
A process for detecting any particles or defects in a wafer.
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Front and Back Side Topography Defect Detection
LIGHTsEE
High throughputNanometer range vertical sensitivitySimultaneous double side inspectionNanotopography and Topography measurementDetection of Slip lines, particles, Hairline cracks, SOI voids, Comets, EPI defects…Compliant with thin or thick wafers, taiko wafers, highly warped wafers
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Air Particle Counters
These air particle counters can measure particle in air, with airflow 2.83L/min and 28.3L/min large air flow .
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Probe Pins
Cobra-Series
Cobra-series probe pins offer long lifetime and low particle contamination for high-density probing applications. We can produce them using different materials and fine pitch geometries.
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Failure Analysis
A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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PXIe-5764, 16-Bit, 1 GS/s, 4-Channel PXI FlexRIO Digitizer
785166-01
The PXIe-5764 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PXIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Absolute Contamination Standards (ACS)
The Absolute Contamination Standard (ACS) is used to calibrate instruments which size and detect particles on the surface of bare silicon wafers. Use ACS to characterize particles, before particles characterize products.
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Micro Compression Tester
MCT Series
This is a strength evaluation tester for micro parts and micro particles generated in powder processing. It is capable of carrying out not only compression tests, but also loading and unloading tests, repeated tests, and various other load patterns, with excellent operability and functionality.
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PCIe-5763, 16-Bit, 500 MS/s, 4-Channel PCI FlexRIO Digitizer Device
786166-01
The PCIe-5763 is a PCI FlexRIO Digitizer Device that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PCIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PCIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Aerosol Optical Tweezers
Bristol Industrial & Research Associates Ltd
Biral Manufacturers Aerosol Optical Tweezing instruments that offer the ability to study individual particles over indefinite periods. Developed in collaboration with the Bristol Aerosol Research Centre at the University of Bristol the instruments are used in research applications such as atmospheric chemistry, pharmaceutical drug development and basic aerosol research.
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Particle Impact Noise Detector
BW-LPD-D4000
FREQUENCY: SINE WAVE 27Hz TO 265HzACCELERATION: 0 TO 20G PEAKSHAKER: 100 FORCE LBS 3/4" IN STROKE 75 IN PER/SEC VELOCITYAMPLIFIER: 250 WATTS MINIMUMD.U.T. WEIGHT: 300 GRAMS PRACTICAL LIMIT @ 20G
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Particulate Filter Management System
PFS-ONE
The highly precise weighing of emission particles has become increasingly important due to new legislative regulations such as Euro 6, WLTP, EPA 1066 or PM 10. PFS-ONE, the Particulate Filter Management System offers different weighing methods. This supports full compliance with current legislation in the automotive and environmental industry and also allows for flexibility of internal testing processes. The system covers the measurement, organization, tracking and control of particulate filter weighing. Built as a modular system, the PFS-ONE can be expanded from a stand-alone installation up to a fully integrated laboratory module and can be used for manual weighing or automated weighing via a robot.
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Particle Size Analyzers
Mastersizer Range
The Mastersizer range of laser diffraction particle size analyzers set the standard for delivering rapid, accurate particle size distributions for both wet and dry dispersions. From assessing product uniformity and solubility, through to optimising packing density to improve final product performance and controlling powder flowability to increase manufacturing efficiency, particle size analysis is critical to understanding and controlling a wide range of properties. The Mastersizer range, with its intuitive software and industry-leading design and ergonomics, enables users to make these particle sizing measurements fast and routine.
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Evaporative Light Scattering Detector
ELSD-LTII
The ELSD-LTII utilizes a high-efficiency LED and enhanced digital signal treatment to minimize noise and deliver optimum sensitivity for trace analysis. An innovative cell design also reduces band broadening and allows sensitivity levels below 200 picograms. The high-performance optical detection system can also be used for combinatorial chemistry and high-throughput screening applications. The new Low Temperature Evaporative Light Scattering Detector (ELSD-LTII) is an easy-to-operate, universal detector that identifies analytes with uniform sensitivity regardless of their spectroscopic properties. It is not a spectroscopic detector. Instead, it removes the mobile phase through evaporation and then makes a light scattering measurement of the dried analyte particles.
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Zeta Potential & Particle Size Analyzer
AcoustoSizer II
The new AcoustoSizer IIs provides thorough characterization of concentrated colloidal dispersions. Directly measuring particle size, zeta potential, pH, conductivity, and temperature, it furnishes the most comprehensive analysis available in a single, turnkey instrument. Based on a flow-through sensor design, the AcoustoSizer IIs can be used in a laboratory batch analysis mode or connected directly to a process slipstream. Built-in syringe pumps provide automated potentiometric and volumetric titration capabilities for accurate isoelectric point and surfactant addition determination.
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Digital Dust Monitor
3443
The Kanomax Digital Dust Monitor – Model 3443 measures aerosol concentrations corresponding to PM10. The intake isolates the aerosol sample so that the optics chamber is kept sterile for improved reliability and low maintenance. The unit measures 0.1 to 10µm particle size aerosol contaminants such as fumes, dust, smoke and mists. It is battery-operated, data-logging, light-scattering laser photometer that gives you real time aerosol mass readings. It is also suitable for clean office settings well as harsh industrial workplaces, construction and environmental sites, and outdoor applications.
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Static Image Analysis System Particle Size
PSA300
The HORIBA PSA300 is a state of the art turn-key image analysis solution. Seamless integration of Clemex's powerful particle characterization software and an automated microscope with high-resolution camera creates an intuitive, easy-to-use imaging workstation. Addressing a need in the field of particle characterization, the PSA300 is a versatile particle size and particle shape analysis tool that can be used in a wide range of applications in the pharmaceutical industries and material science. It is a turn-key solution for labs that want to maintain an analytical microscopy environment with minimum intervention by the operator yet still yield maximum detail in the results.
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Multiphysics Computational Fluid Dynamics (CFD) Simulation & Analysis
STAR-CCM+
Siemens Digital Industries Software
STAR-CCM+ is a stand-alone simulation solution for computational fluid dynamics (CFD), computational solid mechanics (CSM), heat transfer, particle dynamics, reacting flow, electrochemistry, electromagnetics, acoustics and rheology. STAR-CCM+ delivers accurate and efficient simulation technologies through a single integrated user interface and automated workflows. This facilitates the analysis and exploration of complex real-world problems.
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Particle Impact Detection System 10
BW-LPD-DAQ4000HD
This system is capable of vibration testing up to 10 pounds and detecting defects that produce noise, such as loose screws, particles, etc. Right from the start of PIND testing, B&W patented the first MIL-STD compliant system outperforming the competition by over 30% better detection rate as tested by the NBS (now National Institute of Science and Technology) in a well known 1978 study (NBSIR 78-1590 NASA).
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Particle Size Analyzers
NanoBrook Series
Brookhaven Instruments Corporation
Rapid and accurate protein & nanoparticle size distributionsMultimodal & unimodal size distribution softwareISO 13321 and ISO 22412 compliant resultsRange: < 0.3 nm to 10 mThree measurement angles: 15, 90, and 173Ideal for fast, routine sizing applications in research or quality controlHigh power 35 mW diode laserDynamic light scattering at 173 and 90Temperature control, -5 C to 110 CCompact bench top unit, USB connectionMolecular weight determination (relative and absolute through Debye plot)
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Laser Particle Size Analyzer
Easysizer20
Zhengzhou Nanbei Instrument Equipment Co. Ltd
sysizer20 is the latest product of OMEC in Year 2006 and is highly automated, all the process can be done automatically after setting up initial parameters. Multiple sample feeding systems are available to meet your requirements. Applications：Measure the particle size distribution of powder or latex Principle：Use the principle of laser light scattering to determine particle size distribution.
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Portable Particle Counters
Engineered for you, they provide real-time cleanroom particle counting in an easy-to-use, reliable instrument that's ready for measurement.
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Laser Diffraction Systems
Since the release of the 7991 in 1974, the first commercially available particle size analyzer, Microtrac has been at the forefront of Laser Diffraction technology. By continuously improving the instrument technology, Microtrac offers customers a robust portfolio of Laser Diffraction instruments that’s ideal for particle sizing and characterization.
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PXIe-5763, 16-Bit, 500 MS/s, 4-Channel PXI FlexRIO Digitizer
785164-01
The PXIe-5763 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PXIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Powder Flow
The Flodex is an easy-to-use tool for determining the flowability index of a powder over an arbitrary scale of 4 to 40. This index can be used as a specification for raw materials. The test takes into account numerous parameters that affect powder flowability, such as:- Particle size and shape- “Fines”- Unit surface area- Actual density and bulk density- Porosity- Settling characteristics- Electrostatic charges
