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Sapphire/SIC Wafer Flatness and Surface Appearance System
FM200
Sapphire/SIC wafer flatness and surface appearance system provide a previous surface flatness testing solution, though non-contract lighting testing to record the whole information of the surface, rapid and fast measurement for various of surfaces, line and all kinds of surface information.
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(70×90×15mm) C-Band DWDM Full Function Booster EDFA Module
WBA4100-FM02
Hangzhou Huatai Optic Tech. Co., Ltd.
Huatai WBA4100-FM02 series used 70 x 90 x 15mm MSA compact package, is a digital control circuit of DWDM power amplifier function module. Products using the most excellent optical properties, electronic control technology and complete software function is most advanced, wide wavelength range, low noise, excellent gain flatness characteristics and transient characteristics. Application for C-Band 44 wave or the 88 wave of DWDM system.
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Satellite Optical Transmitter
SST-15CW
Hangzhou Softel Optic Co., Ltd.
* Designed for satellite optical system*Wide operating frequency range: 47-2150MHz*Excellent linearity and flatness*Using 1-core single-mode fiber, high return loss*Build-in CWDM, using DFB coaxial small package laser*Output 13/18V, 0/22KHz to LNB working*ALNB mode switch offers the possibility to use either Quattro or QUAD LNB*A distribution of up to 16 optical nodes is possible*Red-LED for power indication*Smaller size and easier installation
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X Band Coupler With Dual Output Threshold Detector
The X Band coupler with dual output has an input power range of either -5 to +10 dBm, or +5 to +20 dBm. Covering 8.0 to 9.5 GHz, insertion loss is less than 1.0 dB and VSWR is 1.5:1. The coupler/detector has two external resistors providing independently settable threshold TTL outputs. The power flatness is ~0.4 dB and hysteresis is 0.1 dB. Cougar can provide this function in other frequency ranges and input power ranges.
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Trihedral Corner Reflectors
TCR Series
Precision radar cross section measurements demand precision calibration targets like the TCR Series trihedral corner reflectors. Manufactured to close mechanical tolerances, TRC trihedrals provide reliable and repeatable calibration standards over a wide frequency range through 100 GHz. Surface flatness and perpendicularity are maintained to 1/100 of a wavelength to insure close agreement with theoretical performance.
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Manhole Mechanical Properties Tester
Manhole mechanical property tester is designed to determine the performance of inspection chamber, manhole frame as well as manhole wall. It can be used to test shear strength and the axial loading performance of manhole base. It can also be used to test Ring stiffness, flatness and ring flexibility test.
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Measurement Of Straightness, Flatness, Positioning Uncertainty Of Round Tables
ELCOLEVEL - Software For 3D-straightness Measurement
Optik Elektronik Gerätetechnik GmbH
ELCOLEVEL is a software with interfaces to electronic autocollimators and inclination levels of different manufactureres. This allows for example the 3D-Straightness measurement (twist-, roll- and yaw-angle) of slides in one and the same measuring procedure.
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L-Band Red/Blue-Band Pass MWDM
WD1616/R, WD1616/B
Hangzhou Huatai Optic Tech. Co., Ltd.
WD1616/R, WD1616/B is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to the combination and separation of L-Band, Red-Band (1589~1603nm) and Blue-Band (1570~1584nm).
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1550/1310~1490nm Wavelength Division Multiplexer
PON-WDM-1543
Hangzhou Huatai Optic Tech. Co., Ltd.
PON-WDM-1543 WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to FTTx PON network to achieve the combination and separation of the 1550nm (CATV) and 1310/1490nm (data).
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Measurement Of Straightness, Flatness, Positioning Uncertainty Of Round Tables >
ELCOWIN - Software For 2D-straightness Measurement With Electronic Autocollimators
Optik Elektronik Gerätetechnik GmbH
The software ELCOWIN serves for the measurement of straightness, squareness, parallelism of slides and flatness of precision tables by the autocollimation principle. ELCOWIN can be used in connection with electronic autocollimators of the ELCOMAT series from Moeller-Wedel-Optical.
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Attenuators
The 01311 attenuator chip series is designed to achieve precision and tight flatness with an attenuation accuracy of ± 0.2 dB on our 1-10 dB pads and ± 0.3 dB on our 11-20 dB pads. SemiGen tests 100% of all attenuator chips prior to shipment to verify that they meet specifications.
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Probe Card PCB's
DTS offers both generic and custom PCBs blanks for probe cards. Probe card PCBs are available for all tester platforms and can be configured for any vertical technology, epoxy cantilever and legacy blade cards. DTS probe card blanks are made to precise specifications required for all probing technologies and are available in high speed and high temperature materials. All probe card PCBs employ a balanced layering construction to maintain tight flatness specifications and minimize warping, allowing good probe planarity. Gold plating on all surface metals facilitates easy soldering and minimizes probe resistance. DTS is continually adding new probe card blanks to its library!
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C-Band DWDM Booster EDFA (WBA-C)
HWA4100 (With SNMP)
Hangzhou Huatai Optic Tech. Co., Ltd.
Huatai HWA4100 series, is designed for C-Band 44 waves or 88 waves DWDM system design power fiber amplifier gain flatness. Products using the most excellent optical performance, the most advanced electronic control technology and comprehensive software features, has a wide operating wavelength range, low noise and excellent gain flatness characteristics.
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Wafer Flatness Measurement System
FLA-200
*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Low Cost Microwave Wideband PIN Preamp Receivers
MR21 (40KHz~18GHz)
Hangzhou Huatai Optic Tech. Co., Ltd.
MR21 series microwave wideband optical receiver, adopts High linear PIN diode and Low noise pre-amplifier IC, within bandwidth of 40KHz~18GHz, they are featured with excellent linearity, high responsibility and superior flatness of the RF response in both, power and phase. They provide an outstanding linearity fiber optical communication for analogue wideband microwave application. Due to avoidance of using expensive coaxial cable or wave guide, there will be no limitation in transmission distance, which improves the signal quality and reliability of the microwave communication. They can be widely applied in microwave communication system such as remote wireless, timing and reference signal distribution, telemetry, measurement and delay line etc as well as 10Gb/s and 18Gb/s high speed communication system.
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Preamplifier, 100 MHz to 18 GHz
87405C
Exceptional gain (25 dB) and flatness (1.5 dB) combined with a probe-power bias connection which eliminates the need for an additional DC power supply, makes these preamplifiers the ideal choice for spectrum analyzer or stand alone applications.
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CATV Booster Optical Amplifier
HA5100
Hangzhou Huatai Optic Tech. Co., Ltd.
Huatai HA5100 series is a CATV booster optical amplifier with gain spectrum band within 1540~1563nm. This kind of optical amplifier is designed for the application of single channel or 1~8 continuous ribbon channels (ITU wavelength). Generally, fiber CATV system operates in single wavelength that has no strict requirement on gain flatness. HA5100 booster amplifier is featured with low NF, high-saturated output power. It is applicable for central bureau, sub-bureau and line relay, as well as other optical communication network. HA5100 is applied most commonly and widely compared with other optical amplifier in CATV system.
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2 Channel Variable Optical Attenuator
S-105
VOA slot module of FOTS system is a module that installs a built-in dual channel MEMS type VOA inside and can do two separate attenuation functions with two each VOA channel being driven individually. This module controls the optical power precisely to maintain the desired output level set by the user by automatically correcting for power drift or fluctuation.This slot module provides high-performance power control features such as high attenuation range, accurate tolerance, stable spectral flatness and low insertion loss in the wavelength range of 1260 ~ 1600 nm. It also offers a particularity that the high-speed drive of attenuation is possible through the combination of high-speed FPGA processor and high speed response time (within 1 ms) VOA. With the provided driving program and GUI, users can set up various attenuation program of each VOA channel such as sequential attenuation step, periodic attenuation and operation time
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E-Band Low Noise Amplifier MMIC
AWL-7186
The AWL-7186 is a 4-stage ultra-low noise amplifier that provides a noise figure of less than 3.5 dB, an output P1dB of +8 dBm, and an adjustable gain range of 15 dB. The MMIC features exceptional gain flatness and superior noise performance over a very wide bandwidth. It is implemented in 0.1 um GaAs PHEMT technology.
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Flatness, Bow, Warp, Curvature, Glass Thickness + Optics Test Equipment
Mobile Wedge Angle Sensor WAS 160
Optik Elektronik Gerätetechnik GmbH
Portable sensor for measurement of radius and wedge angle. Application: windshields of cars, helicopters, airplanes.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Double IC Optic Node
OX 732
Converts even weak Optic Signals to a high quality RF Signal. LED BAR Optic Level Display has been provided for ease of system maintenance. They are best suitable for Analog as well as Digital transmission to maintain BER, MER Characteristics. Green Technology incorporated - Aluminium Housing for maximum heat dissipation.- Frequency 40 ~ 1000 MHz- Optical Wavelength : 1290 ~ 1600 nm- Flatness ±0.75 dB- LED Bar Display for Optic Signal Level- High C/N, CSO & CTB Characteristics- Inward Extruded Aluminium Channels for Maximum Heat Dissipation- High Voltage Surge Protection- -11 dBm Sensitivity- RF O/P at 0 dBm : 110 dBµV
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Surface Form Analysis System
Tropel® FlatMaster®
Tropel® FlatMaster® Surface Form Analysis System Fast and Precise Measurements of Ground, Lapped, Honed, Polished and Super-finished Components. The Tropel® FlatMaster® offers industry leading performance for surface form measurements to precision component manufacturers. Our non-contact optical technique analyzes the entire surface of the part in seconds, regardless of its size or complexity. The FlatMaster provides five nanometer resolution and a standard accuracy of 50 nm (2.0 μ). It rapidly and accurately measures flatness, line profile, radius and other surface parameters on a variety of materials and surface finishes.
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Mask Flatness Measurement System
Tropel® UltraFlatTM 200 Mask System
The Tropel® UltraFlatTM 200 Mask System was designed specifically for the photomask industry. It delivers the lowest measurement uncertainty for ever-tightening mask flatness specifications. Shrinking device features require not only flatter wafers, but flatter masks.
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Geometrical Measurement Software
PRÜFTECHNIK Condition Monitoring GmbH
Activate your machinery more quickly, and help it run longer. PRÜFTECHNIK geometric laser alignment tools and software enable you to easily check and adjust your machine geometries for: straightness, flatness, level, inclination, plumbness, parallelism, and right angle check. Our tools are powerful, precise, and easy to use on a vast range of machinery—they can measure for the most demanding alignment jobs, including a bore of almost any diameter, and/or any surface type or inclination. Find the right geometric measurement tool for your machines.
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900 MHz Trunk Hybrid Amplifier
AS 1111
Hybrid Amplifier used in trunk and branch lines specially designed to serve the need of cable systems with long trunk cables. They incorporate Good Quality Hybrid IC Module to obtain better features.- Frequency Range: 40 ~ 900 MHz- Output Level: 102 dBµV- Separate IN & OUT Fuses- Level Flatness: ±0.75 dB- 32 dB Gain (40 dB Optional)- Incorporates Good Quality- Hybrid IC Module- Hybrid IC Protected
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Pulsed-DC Systems
Extend process innovation with Advanced Energy’s comprehensive pulsed-DC suite. Minimize arcing, enhance deposition rate, improve film flatness and packing density.
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Multi-Channel Attenuation Control Unit (5-channels), DC to 6 GHz, 0 to 121 dB, 1 dB Step
J7205A
The J7205A is a multi-channel (5-channels) attenuation solution for signal attenuation and conditioning of up to5 devices under test (DUT). Operating frequency from DC to 6 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7205A reduces cost of ownership and provide the best measurement accuracy.
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Multi-Channel Attenuation Control Unit (5-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step
J7205B
The J7205B is a multi-channel (5-channels) attenuation solution for signal attenuation and conditioning of up to 5 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7205B reduces cost of ownership and provide the best measurement accuracy.
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Semi-automated Metrology System
Full wafer surface scanning for thickness, thickness variation, bow, warp, sori, site and global flatness