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product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1T30-4
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Low Noise Pre-Amplifiers
Low Noise Pre-Amplifier and companion external low noise amplifier (LNA) are used to amplify low level microwave signals. The Pre-Amplifier contains an AC/DC power supply, internal low noise amplifier, and a bias tee to source a DC bias voltage on the RF input connector.To overcome cable loss between the test antenna and the Pre-Amplifier assembly, a remote low noise amplifier (LNA) is mounted directly onto the 10 GHz antenna. A bias tee inside the Pre-Amplifier chassis powers the remote LNA through the coax cable interconnecting the pre-amplifier and the 10 GHz test antenna.
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1T24-6-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1I8-7-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1L-6-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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120 GHz Frequency Extender, Pulsed DC Bias
N5295AX02
The N5295AX02 is a compact and broadband frequency extender with built-in pulsed bias-tee and provides 10 MHz to 120 GHz single-sweep measurements with N5292A test set controller systemized with a PNA/PNA-X B vector network analyzer.
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1L-8-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1J-10-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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AC Power Sources
8500 Series
The EEC 8500 Series is the most power dense and functionality rich power source in our history, giving you improved capability, functionality, and a reduced footprint all in one series. This series is manufactured or simulating common grid faults, voltage dips, and other power abnormalities. The 8500 Series provides an output voltage up to 310VAC and an output frequency ranging from 5 Hz – 1,200 Hz making it the obvious solution for all kinds of applications. Not to mention, an enhanced interface to all models completely designed with the end-user in mind. Our 8500 Sources can be configured as a simple AC Power Source in MANUAL mode, as an upgraded option with Standard mode or incorporating all functions with Advanced Mode. Advanced mode adds the benefits of a sweep of voltage, frequencies, transients, and DC bias over the course of a single sequence or several different tests. The 8500 Series includes the following models: 8505, 8512, 8520, 8530, 8540, & 8560.
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1Z-2
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1J-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T30-2-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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2 GHz to 6 GHz, 25 W Power Amplifier Module
HMC7748
The HMC7748 is a multistage power amplifier (PA) that provides 25 W of saturated output power across the band of 2 GHz to 6 GHz. It draws 0.7 A from a 12 V supply and up to 4 A from a 28 V supply. Input signals of as much as −8 dBm are acceptable, and the module has small signal gain of 60 dB. The 12 V supply is regulated internally and generates the negative voltage required for the gate bias. Built-in bias sequencing prevents the drain voltages for the amplifier stages from being applied without the negative voltage present, which protects the amplifiers if 28 V is applied without 12 V supply applied.
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PIN Photodiode
PIN photodiode is a kind of photo detector, it can convert optical signals into electrical signals.This technology was invented in the latest of 1950's. There are three regions in this type of diode. There is a p-region an intrinsic region and an n-region. The p-region and n-region are comparatively heavily doped than the p-region and n-region of usual p-n diodes. The width of the intrinsic region should be larger than the space charge width of a normal p-n junction. The PIN photo diode operates with an applied reverse bias voltage and when the reverse bias is applied, the space charge region must cover the intrinsic region completely. Electron hole pairs are generated in the space charge region by photon absorption. The switching speed of frequency response of photo diode is inversely proportional to the life time. The switching speed can be enhanced by a small minority carrier lifetime. For the photo detector applications where the speed of response is important, the depletion region width should be made as large as possible for small minority carrier lifetime as a result the switch speed also increases.
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1V-8-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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DiodeTester
FECPLS500
Frothingham Electronics Corporation
The PLS500 automatic tester is designed primarily to do SURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses and THERMAL RESPONSE either in DVF (mV) or degrees per watt. All three test types may be performed in a single test program.
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1Z-10-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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110 GHz Frequency Extender, Pulsed DC Bias
N5293AX02
The N5293AX02 is a compact and broadband frequency extender with built-in pulsed bias-tee and provides 10 MHz to 110 GHz single-sweep measurements with N5292A test set controller systemized with a PNA/PNA-X B vector network analyzer.
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1A-8
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Zero Bias Schottky Detectors
KRYTAR Zero Bias Schottky Detectors are specifically designed for use in today's high-performance microwave instrumentation and systems. KRYTAR detectors are designed for such applications as power measurements, analyzing radar performance, leveling pulsed signal sources, AM noise measurements, system monitoring and pulsed RF measurements in ultra-broadband and mm-Wave applications.
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Regulators For Bias Supply
Renesas' low cost linear regulators generate a low voltage bias supply from intermediate distributed voltages commonly used in telecom and datacom applications. These devices may be used as start-up or as continuous low power regulators.
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Standard 1.02 (29.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-62T1-4
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1T30-6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1B-8-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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JFET Input Amplifiers
Analog Devices JFET input op amps or FastFET high speed (>50 MHz) input op amps provide high input impedance and ultralow input bias currents for high speed applications. The majority of our FET input op amps feature wide supply ranges from +5 V to 12 V or higher and feature rail-to-rail outputs enabling wide dynamic range.
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GPS over Fiber
*High Dynamic Range GPS to Fiberoptic Transmitter and Fiberoptic to GPS Receiver*Compact NEMA rated outdoor Fiber Transmitter provides +5VDC Bias for GPS Antenna LNA*Rack mounted Fiber Receiver provides 8 RF outputs and integrated monitoring and alarming*Cost effective solutions for distribution of GPS signal over long distance
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1I-2-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High Current Probes
*Low internal resistance to minimize arching*PogoPlus bias ball design*High current optimized base material and plating*Higher temperature spring design*Specialized high current tip geometry
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Cost-Effective ATE System
PRO RACK ATE
Qmax Test Technologies Pvt. Ltd.
Pro-Rack is a cost effective ATE System, which comes with Modular Structure provision option to improvise and enhance much instrumentation based on the user’s requirements. Basically it is designed to cater to the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FPGA VLSI chips. AC /DC parametric tests enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity ,Tri-state leakage currents, AC parametric measurements such as Input / Output Propagation delay Rise time / Fall time to further enhance fault coverage. Pro-Rack is designed with VPC Mass Interconnect adapter with 16 bit fixture ID interface to the UUT through simple clips and probes or through card edge or through a bed of nail test fixture.
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Light 0.48 (14.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-62J-2
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
