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- Applied Instruments, Inc.
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Satellite Signal Level Meter
VSAT 7850
The VSAT 7850's extreme ruggedness, husky battery, ease of use, and versatility, make this the ideal meter for professional VSAT satellite technicians.
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Shield Level / Pathloss Equipment
PAMS & PAMS-C
PAMS is a user-friendly, transmitter and receiver system that measures shielding effectiveness in RF shielded enclosures. Lightweight and compact, each PAMS unit measures approximately 12” x 5” x 5” and weighs 5.5 lbs., making PAMS ideally suited to field measurement tasks. Rugged construction insures instrument survivability in a field test environment. PAMS-C is a simple and efficient solution for quickly identifying shielding faults in an RF shielded enclosure. Cousin to the original PAMS used extensively by customers operating RF Shielded Enclosures, PAMS-C gives commercial end-users everything needed to measure shielding effectiveness levels of critical infrastructure - all with minimal or no interruption to normal operations.
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Vibration Control
m+p VibControl vibration controllers for advanced vibration control and shock testing from 4 to hundreds of input channels are used by many of the leading environmental test laboratories throughout the world. The endusers appreciate the intuitive operation, the extensive analysis and reporting functions, the numerous upgrade possibilities and, of course, the excellent stability and high quality level of the m+p vibration control systems. Applications range from normal to very extreme conditions, and also include rough transportation circumstances.
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Scienlab Battery Test System – Module Level
SL1001A Series
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
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PXIe-6547, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument
781011-02
PXIe, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument—The PXIe‑6547 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 100 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6547 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Crossing Control Bypass Switch
XCBS
The XCBS is permanently wired into each crossing warning system, and can be configured with either a removable or non-removable bypass key. Simply connect the crossing control circuits to the designated terminals on the XCBS. The rotating "knife switch" on the left side of the XCBS allows the crossing warning system to be controlled for manual test purposes. To prevent unnecessary operation of the crossing warning system, insert the key and select "bypass", rotate the knife switch to "bypass" and the crossing is disabled. The non-removable bypass key adds an additional level of security for the Bypass function. Optional hookup can be made to the auxiallary terminals to include the activation of a strobe or event recorder input when the XCBS is placed in the "bypass" position.
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Offline MPEG Analyzer
MSight
Instantly jump to any stream location with fast seeking which makes navigation simple and easy. MSight Analyzer will jump to the exact location of any error identified in a compliance test to allow full inspection of all the stream data at that location. Complete coverage with support for VC-1, H.264/AVC, MPEG-4 part 2, MPEG-2, MPEG-1, and system level (program and transport stream analyzer features) in a single tool.
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Standard Gain Horns
Standard gain horns can be used to experimentally determine the gain of other antennas by using the substitution method. The standard gain horn and the antenna under test are alternately connected to a well matched detector system in order to compare their relative power levels. The power level difference is then added to the appropriate level of the calibration curve to determine the absolute gain of the antenna under test.View more Standard Gain Horn Antennas
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Backplane Test System
402LV
Very High Pin Count Level IV Backplane Test System. To ensure that Testronics maintains its leadership position as the premier supplier of backplane testers, we will be introducing our solution to testing high pin count / very large backplanes, the Model 402.
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Low PIM Coaxial Switch, DC to 20 GHz, SP6T
87106Q
Low passive intermodulation (PIM) is crucial for applications where two or more transmitted signals share a common antenna or whenever the transmitter signal is too high or the receiver is sensitive to high intermodulation. The Keysight 87106Q is a low PIM SP6T coaxial switch, operating from DC to 20 GHz, which can help to keep the system PIM level low. A guaranteed 0.03 dB insertion loss repeatability and 3 million cycles of operating life ensures signal integrity, improves testing efficiency, and ultimately maximizes test throughput.
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IP VIDEO MARGIN TESTER
IPMT-3
The IPMT-3 is a precision attenuator used to test IP video systems to insure that you have an adequate digital signal margin. Digital signal margin is the amount of signal level above the digital cliff that you have in your system to prevent a picture failure from occurring. IP cameras will give you a perfect picture until the network cable loss reaches beyond the minimum allowable signal level and then you suddenly get no picture at all. This effect is called the digital cliff, because like walking off of a cliff, everything is great till you take the last step off the edge and then all is lost.
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68 Pin VHDCI Connector & Cable Accessories
These 68 Way VHDCI connectors & cables provide a high-density 0.5A solution that is suitable for use to 30Vac. We have developed this range of standard connection solutions to simplify the task of integrating products into a test system, the high density and skill levels involved in terminating this connector mean that we strongly recommend that you use our connection solutions. This category of connectors are not compatible with our products, however, are offered for developing a connection solution for use with other vendor’s products. You can also try our Cable Design Tool to graphically design a customized cable assembly.
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Universal Cable/Harness Tester
LX-686
Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface,．·Up to 1500Vdc/1000Vac Test Voltage ,．·256 Max. Test Points , (Max of all series)．·500 Max Files Memory,support USB or PC unlimited expansion,．·Arc detection level 0-9 ,auto prompt．·Adopted high resolution colour 640*480 TFT LCD ,．·Providing Single-End ,Multi-segment ,Standard ,and Spot test of wire.．·Auto Scan and Auto Pin Search ,．·The system provides advanced instant open-circuit, short-circuit, continuity test,．·Intermittent Conductance Test,．·Intermittent Open/Short Test ,．·Full Programming Sequence Test ,．·Versatile I/O Ports for application ,．·Statistics and Print Function,．·Provide REMOTE interface, communicate with PLD auto test fixture,．·Provide personalized customization according to different requirements,
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Systems Integration for Circuit Card Assembly
Teledyne Advanced Electronic Solutions integrates CCAs and other sub-assemblies, cables and fabricated parts into system modules shipped directly to customers for integration into their products.- Box Build: custom built to order system solutions- High complexity box assemblies and subsystems- High frequency RF box assemblies and subsystems- Full functional RF testing up to 26 GHz (K band)- Multi-level systems integration – build and test modules and CCAs and integrate into higher level assemblies- Custom cell design for customer subsystems- Special bonding processes including thermal management and vibration- Robust torque and FOD control programs- System level testing including functional, vibration and thermal- Complex harness fabrication and integration- Fiber-Optic and RF waveguide integration and testing- Large system capacity in excess of 200 lbs.- Configure to order – Integrate different options, firmware, configurations, etc across a single order as required
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Mechanical Design
In support of system, test and our tooling business, our mechanical engineering team is second to none in offering innovative, yet cost effective solutions for your needs.Whether it is a scalable test fixture solution or a complex, high accuracy torque tooling solution, our team of dedicated mechanical engineers can offer the right solution, with the right level of innovation to give your solution a competitive edge.
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High-Power, Rack-Mount Amplifiers
High-power, rackmount amplifiers utilize advanced power combining techniques to achieve high output power levels. These integrated amplifiers include advanced cooling capabilities and other customizable features. Though a focus on modularity, these rackmount amplifiers are ready for easy integration into a larger system or lab test bench.
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Aerospace and Aviation Solutions
SCOEs and EGSEs by LXinstruments are used during test and validation of satellite assemblies and modules in aerospace applications. As an example, we implemented solar array simulators, battery simulators and high-power load racks for a German satellite manufacturer for testing satellite power supply systems. Due to the high power ratings, the systems are partially equipped with water cooling. Specialized switching modules were developed for switching DC currents at high voltage levels; these can be programmed with SCPI commands via Ethernet.Our modular OTP² functional test platform is ideally suited for implementing durable, reliable test systems, e. g. for in-flight entertainment applications. Since the OTP2 platform is based on open interfaces, it can be quickly and easily adapted to any required communication busses and ARINC interfaces.
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PXIe-6544, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument
780992-02
PXIe, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument—The PXIe‑6544 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXIe‑6544 can sample digital waveforms at up to 100 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6544 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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Low PIM Coaxial Switch, DC to 20 GHz, SP4T
87104Q
Low passive intermodulation (PIM) is crucial for applications where two or more transmitted signals share a common antenna or whenever the transmitter signal is too high or the receiver is sensitive to high intermodulation. The Keysight 87104Q is a low PIM SP4T coaxial switch, operating from DC to 20 GHz, which can help to keep the system PIM level low. A guaranteed 0.03 dB insertion loss repeatability and 3 million cycles of operating life ensures signal integrity, improves testing efficiency and ultimately maximizes test throughput.
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Tri-Temp Strip Level Test Instrument
Apollon
APOLLON is a tri-temperature strip-level test system for motion sensors. It is especially designed for high-end Automotive and Industrial applications. APOLLON offers extremely good testing conditions: high stimulus and temperature accuracy and low noise level.
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Air Data Calibration
Fluke calibration offers digital pressure monitors, air data calibrators and laboratory standards for air data pressure range calibrations. Each of these systems feature pressure ranges, measurement units and features specific to calibrate air data test sets and RVSM compliant air data instruments. Models include 2468 Ruska and ADCS-601 DHI primary level standards; 7750i Ruska air data controller/calibrator and RPM4-AD DHI reference pressure monitor.
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Test Automation System
RT-Tester
Verified Systems International GMBH
Designed to perform automated hardware-in-the-loop tests and software component test on process or thread level for embedded real-time systems. The functional components of RT-Tester can be structured as shown in the figure to the left. Please click on the small image to enlarge the picture. The System Under Test (SUT) denotes the object to be tested.
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Reference Thermapen®
Until now you would have spent hundreds more to get this level of accuracy in a NIST-Traceable standards thermometer. Our Reference Thermapen takes lab accuracy into the field. Each unit is factory calibrated at 5 test points and includes a UKAS accredited calibration certificate with test data. A true "system calibration" is performed matching its Platinum RTD sensor and the built-in electronics so all errors are included in the spec.
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Microcomputer Three-phase Relay Test Set
Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations.
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Single-phase Relay Test Set
Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations. It is further necessary that these expanding testing capabilities be met with a similar improvement in the simplification of a test instrument’s user interface and software control.
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Advanced Diagnostics for ScanExpress™ JET JTAG Embedded Test Solutions
ScanExpress JET Advanced Solutions
ScanExpress JET advanced diagnostics add additional diagnostic resolution with fully automated analysis translating functional test results to down to the net and pin level, even with BGA packages.The seamless integration with ScanExpress JET and ScanExpress Runner as well as the ability to output ScanExpress Viewer fault reports for PCB visualization make ScanExpress JET Advanced Diagnostics a must-have tool for any JTAG test system.
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Programmable High Power DC Power Supply
ADG series
Preen’s ADG series is a programmable DC power supply with high power density and high output power, and offers many great advantages on response time, accuracy and output voltage range. ADG is an excellent source for testing or facility type applications, such as aerospace, renewable energy, automated test system, battery and server. With power level up to 80kW per unit, the ADG series provides output voltage up to 1000V and high output current of 2000A after custom modification.
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PXIe-6571, 1-Slot, 100 MVector/s PXI Digital Pattern Instrument
786320-01
1-Slot, 100 MVector/s PXI Digital Pattern Instrument - The PXIe‑6571 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. It also includes debugging tools … like Shmoo, digital scope, and viewers for history RAM, pin states, and system status. The PXIe-6571 requires a chassis with 82 W slot cooling capacity, such as the PXIe-1095.
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Programmable Low-Ohm Meter
DU5210/5211
Delta United Instrument Co., Ltd.
20m ~ 2Mtest range, 0.1% accuracy Provided Level and Pulse measurement modes, can be lower temperature influence in Pulse Mode Provided HI/LOW limit and BIN Sorting comparator function, to meet your needed 100 sets of memory, can be saved test parameter and comparator setting, easy to use. Auto Calibration Program Function, to easier your calibration procedure. (Specificity calibrator needed) Cover up free, system firmware upgrade can be update via RS-232, easy to maintenance High speed FADC, max. test speed up to 80 meas./sec, faster your automation equipment 240*64 Graphic LCD display, can be read the reading clearly and easier. User friendly programmable interface, easy to use Provided RS-232C and Handler combinatorial interface option, to meet your needed
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PSG RF Analog Signal Generator, 100 kHz to 9 GHz
E8663D
Tackle demanding radar & satcom measurements with metrology-grade performance, including high output power & superior level accuracyUse as an ideal reference in phase noise test systems or for analog-to-digital converter testing with the lowest phase noise in a commercial sourceCharacterize devices & circuits by adding AM, FM, M & pulse modulation to your signalImprove existing test system performance: E8663D is built on the outstanding legacy of the 8663A & is fully code compatible
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JTAG External Modules for Cluster Test
JEMIO
The JTAG External Modules JEMIO™ for Cluster test are intended to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system. For many designs, Boundary-Scan has adequate access to on-board signals, but signals that go off the board often cannot be tested by a JTAG tester. By adding JTAG access to these off-board signals, JEMIO™ modules can increase the board's JTAG test coverage, possibly reducing the need for implementing another test method or for developing alternative tests to reach the required level of test coverage.
