Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
- Pickering Interfaces Inc.
product
Switching System Test Tools
eBIRST
The eBIRST toolset consists of three different tools that support 200-pin LFH, 78-pin and 50-pin connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence. These tools work by measuring the path resistance at the switching system external connectors using four-wire measurements, quickly establishing whether the path is good, has increased resistance or has failed. Below are links to various eBIRST tool information:
-
product
Strain Gauge Test
This test measures the structural stresses induced in equipment when subjected to various environmental and operational loads. Strain gages, which are resistive devices whose outputs are proportional to the amount that they are deformed under strain, are placed at selected locations to yield stress levels which may then be compared to design allowable limits.
-
product
Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
-
product
Other Passive Probes
Probes connect the input of the oscilloscope to test points on the device under test (DUT). There are many types, including: high impedance passive, low capacitance, single-ended active, differential active, high voltage, and current probes. This is the first in a series of three articles on probe selection and application, and will focus on passive probes. Part 2 and part 3 will address active probes and current probes, respectively.
-
product
Optical signal transmission
Digital
The fibre optic cable are used to transmit digital signals from the device under test under EFT/burst interference.
-
product
1149.6 Boundary Scan Feature, GTE 10.00p
K8213B
Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.
-
product
PXIe-4112, 2-Channel, 60 V, 1 A PXI Programmable Power Supply
782857-01
The PXIe‑4112 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
-
product
Pressure Comparator (System D)
P Series
AMETEK Sensors, Test & Calibration
The P-Series (System D) comparators are hydraulic screw pumps designed for easy, controlled, high pressure generation. Each comparator includes a 4 connection manifold, which can be used for the reference indicator, the device under test, a fine adjust, an isolation valve, or a fluid reservoir. The adjustable reference pressure port lets you set your reference gauge at the best viewing angle. Three models are available for hydraulic oil, water, or both.
-
product
Pulse Function Arbitrary Noise Generator
81160A
Generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolution; Selectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standards; Glitch-free timing parameter changes allow engineers to change the frequency without drop-outs or glitches and enable continuous operation without rebooting or resetting the device under test; ...show more -
product
RSE Wireless EMC Spurious Emission
TS8996
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
-
product
Artificial Power Supply Network
KH3762
Beijing KeHuan Century EMC Technology Co,.LTD
The artificial power supply network (also called the power supply impedance stabilization network) should be able to provide a stable impedance to the device under test in the radio frequency range, isolate the device under test from high-frequency interference on the power grid, and then couple the interference voltage to the receiver.
-
product
Scanner Probe
RFS set
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shield...show more -
product
DC Power Module 0 To 5 V, 0 To 10 A, 50 W
N6731B
The Keysight N6731B, a 50 W basic DC power module, provides programmable voltage and current, as well as measurement and protection features at a very economical price. Use this module to power the device under test or ATE system resources, such as fixture control.
-
product
Regenerative Power System, 160 V, ±125 A, 10 KW, 400/480 VAC
RP7946A
The Keysight RP7946A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
-
product
CAN MiniModules
Measurement points distributed throughout a device under test, whether in a vehicle or at a test bench place high demands on the measurement technology. Measurement modules must be compact, robust, reliable, and easy to use. CSM meets all these requirements with its long-term proven CAN MiniModule series.
-
product
Scalar Network Analyzer Extenders
A Scalar Network Analyzer is a type of RF network analyzer that is used to measure only the amplitude properties of a DUT (Device Under Test). Unlike a Vector network Analyzer, it does not measure both amplitude and phase of the DUT.
-
product
PXIe-2748, 3 GHz, 16x1 PXI RF Multiplexer Switch Module
780587-48
PXIe, 3 GHz, 16x1 PXI RF Multiplexer Switch Module—The PXIe‑2748 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 3 GHz in production test applications. The high channel count of the PXIe‑2748 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.
-
product
Test Port Adapter Set, 1.85 Mm To 1.85 Mm
85130H
The Keysight 85130H test port adapter protects the test set port from being directly connected to the device under test. This adapter has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 1.85 mm to 1.85 mm male adapter and a 1.85 mm to 1.85 mm female adapter. The frequency range for these adapters is dc to 67 GHz with a return loss of 23 dB or better.
-
product
Modular Power
RFP DC High Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
-
product
Ethernet & IP Testing
Ethernet speeds are increasing. Networks are becoming more intelligent. Topologies are scaling to sizes never seen before. Spirent understands this growth. We support a variety of speeds and protocols so you can test under realistic conditions. We support unparalleled port and application scale so you can verify your products and services under expected loads. The Spirent products featured in this brochure are designed to support 800, 400, 200, 100, 50, 40, 25,10, 5, 2.5, and 1G.In today’s envir...show more -
product
IP X3, X4 - Rain Test Chamber
The rain water or moisture penetrating through a leak in the case, can often reach into the circuit board and lead to failure of the equipment. This problem is frequently encountered with external equipments and devices during storage, usage or transportation in a rainy weather. Therefore, the automotive industries and various research and developmental units often use Rain Test Chambers to test the quality and performance of the product in such extreme environments.Weiber's Rain Test Chambers a...show more -
product
Low Resistance Ohm Meter
6237 DLRO
Standard Electric Works Co., Ltd
The 6237 DLRO is a "full feature professional instrument". The RUGGED and "O-RING" SEALED Digital LowResistance Ohm and Contact Meter is specially designed to measure very low resistance accurately and give the result directly on the large and clear LCD. The 6237 DLRO makes measurements by passing a constant current through the device under test (generally a conductor, contact or low resistance) and measuring the voltage across it. The Low Resistance is then calculated by ohm's law. This superb ...show more -
product
PXIe-4141, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit
781743-01
PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can...show more -
product
PXI 2 Pole 18 way Mux with 2 Pole 18 way sen
40-658-002
This PXI multiplexer combines a 2-pole 18-way power distribution MUX with a second lower power 2-pole 18-way MUX in one convenient single slot PXI module.The module is ideal for power distribution where power and sense signals are required to be connected to an array of devices under test. This multiplexer is also convenient for making 4 wire low resistance measurements by supplying the resistor under test with high current through the power MUX and sensing the voltage drop through the sense MUX.
-
product
Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
-
product
AC Voltage Proving Units
HLV-2
Standard Electric Works Co., Ltd
The AC Voltage Detectors and AC Voltage Testers utilized to determine if the devices under test are functionally working. They are not a calibrator and cannot be utilized for calibration.
-
product
Striptest Contactors
ULTRA® CONTACT Series
ULTRA® CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
-
product
NI-9228, ±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module
783861-01
±60 V, 1 kS/s/ch, 24-Bit, Simultaneous Input, 8-Channel C Series Voltage Input Module - The NI‑9228 performs differential analog input. With channel-to-channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. The NI‑9228 is simultaneous sampling with two options for filtering: a low-latency filter or a 50/60 Hz rejection filter. The low-latency filter enables users to use this module in industrial or control applications while getting better external noise rejection.
-
product
Mobile Communications DC Sources (45 W, 100 W):
663xx Series
Use this family of specialized DC power sources to test your digital wireless appliances. All models offer DC sourcing, current sinking, fast transient response, GPIB, and measurement capabilities to help you with the unique challenges of simulating batteries and battery packs and measuring the current drawn by your device under test.
-
product
Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
-
product
RFFE Protocol Analyzer and Exerciser
PGY-RFFE-EX-PD
Prodigy Technovations Pvt. Ltd.
RFFE Protocol Analyzer (PGY-RFFE-EX-PD) is the Protocol Analyzer with multiple features to capture and debug communication between host and design under test. The RF Front-end control interface (RFFE) Serial bus interface is emerging as a chosen for controlling RF frond end devices. There are variety of front end devices such as Power Amplifiers (PA), Low-Nose Amplifiers (LNA), filters, switches, power management modules, antenna tuners. It is widely used in mobile devices.
