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Qualification
fulfills an absolute condition.
See Also: Performance Testing, Validation, Characterization
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Protocol Analyzer
Multi-speed, Ethernet protocol, multi-function test platform. Used in the development, qualification, manufacturing and support of equipment with external or embedded communications interfaces.
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END-to-END VALIDATION TESTING
SANBlaze VirtuaLUN NVMe Initiator is the key piece of test equipment for anyone needing to test NVMe target devices. The VirtuaLUN feature set provides a unique set of functions applicable in all aspects of a product lifecycle; from development to design validation to test and QA. The ability to drive NVMe targets with a wide range of configurable attributes provides engineers with a flexible, scalable tool to simulate real disk and memory access environments and issues. Development, qualification and certification test cycles can be highly automated, reducing time and surfacing issues and errors.
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Electrical Probe Systems
INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
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Bluetooth LE Protocol Qualification Tester
conformanceHarmony
The conformanceHarmony LE Tester is a robust testing solution recognized by the Bluetooth SIG as a validated test platform, focused on the qualification testing of products to the Bluetooth low energy specification. It is an integrated software/hardware test platform for Bluetooth protocol qualification testing that provides:
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Low Voltage Differential Signaling (LVDS)
Available in QML-Q and QML-V processing flows, CAES LVDS solutions meet all of the stringent mechanical qualification requirements defined in MIL-PRF-38535.
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Emulator
GCI E84
The GCI E84 Emulator is the world's leading tester for development, implementation and qualification of products that must comply with the SEMI E84 Standard. It provides the industry-standard automated test plans that are utilized by virtually every 300mm FAB and equipment manufacturer worldwide. GCI testers are the only solutions that guarantee 300mm factory automation interoperability.
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Quickly & Accurately Validate Any Pluggable Transceiver from 10M to 100G
iOptics
iOptics offers a complete, powerful and easy-to-use tool for CFP and QSFP qualification and can validate the full range of low- to high-rate transceivers including SFP, SFP+, XFP, CFP, CFP2, CFP4, QSFP+ and QSFP28. iOptics offers a faster, streamlined and automated test sequence aimed at quickly and simply validating any type of 10M to 100G interface. It is the ideal solution for multirate field commissioning with a simple one-button pass/fail. It offers automated stress testing for lab qualification and is also ideally suited for data center and data center interconnect (DCI) testing.
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Broadband DSL Test Set
Copper Pro 990DSL
The 990 CopperPro Series II provides a full range of troubleshooting, fault locating, testing and qualification capabilities. That means top performance with fewer tools to carry.
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NI LabVIEW Development Services
Software development using National Instruments LabVIEW is a core skill of the Simplicity AI which is an NI Alliance Partner and has a technical team with over 60 years of experience in the product. Engineers are accredited with Certified LabVIEW Developer or Certified LabVIEW Architect qualifications, and several are certified by National Instruments to teach LabVIEW training courses.
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Mechanical Tester
TriboLab CMP
Leveraging over 20 years of CMP characterization expertise with its predecessor product (Bruker CP-4), TriboLab CMP brings a complete set of capabilities to the industry-leading TriboLab platform. The resulting accuracy and measurement repeatability enables the highly effective qualification, inspection, and ongoing functionality testing required throughout the CMP process.
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EEE Component Testing and Screening Services
DPACI performs 100% screening as well as qualification testing on electronic parts supplied to the high reliability commercial, industrial, space, and U.S. military sectors. We generate software and hardware to test microcircuits, discrete semiconductors, hybrids, PEMS, and other EEE electronic components to exact customer and military specifications. Our engineering experience in electronic parts screening, qualification, and in-house test fixture fabrication allows us to provide value added components in a timely manner.
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Testing Services
*Programmable Multipoint Tester*Over 8,000 programmable test points (DWV, Capacitance, Insulation Res., 2/4-Wire Resistance, etc.)*1500VDC / 1000 VAC Dielectric Withstanding Voltage (DWV)/ Hi-Pot (Programmable Dwell times)*Full Electronics laboratory complete with state of the art testing equipment*Custom Unit Testing (Designing of Specialized Test fixtures)*EMI Testing*Temperature and Humidity Testing*Shock Testing*Vibration Testing*Sand and Dust / Altitude Testing*Military Qualification Tests Performed
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EDXIR-Analysis Contaminant Finder/Material Inspector
EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues identification results and the degree of matching. it can also be used to perform EDX or FTIR data analysis on its own. The library used for data analysis (containing 485 data as standard) is original to Shimadzu, and was created through cooperation with water supply agencies and food manufacturers. Additional data can be registered to the library, as can image files and document files in PDF format. It is also effective for the linked storage of various types of data as electronic files.
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Device Modeling Products
Our products and premier solutions provide for characterization and modeling of cutting-edge CMOS and compound semiconductor devices. Keysight is the only vendor that provides complete end-to-end modeling solutions, from automated measurements, accurate device model extraction, comprehensive qualification to final process design kit (PDK) validation. Comprehensive modeling services are offered, supported by Keysight's expert engineers and advanced labs. Our key device modeling and characterization EDA software and hardware solutions are included below.
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Fiber Optic Qualification & Dispersion Test Links
8800 Family
Delaire USA qualification test systems are designed to act as worst-case links for bandwidth/dispersion and attenuation, or to meet the customer's loss, dispersion, and distance requirements for custom applications. Because the test links are constructed from hand-selected, industry-standard fiber and not simulated with dispersion elements, all of the effects including loss, dispersion, and fiber nonlinearities are present and authentic. Typical applications include optical transciever testing and qualification for 40G AND 100G systems
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EDX-FTIR Contaminant Finder/Material Inspector
EDXIR-Analysis Contaminant Finder/Material Inspector
EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues identification results and the degree of matching. it can also be used to perform EDX or FTIR data analysis on its own. The library used for data analysis (containing 485 data as standard) is original to Shimadzu, and was created through cooperation with water supply agencies and food manufacturers. Additional data can be registered to the library, as can image files and document files in PDF format. It is also effective for the linked storage of various types of data as electronic files.
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Low Temperature Operating Life (LTOL) Test
LTOL
LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.
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Microelectronics Test & Engineering Services
EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems
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SuperGuard C Library Safety Qualification Suite
The SuperGuard C Library Safety Qualification Suite is a requirements-based test suite for the C standard library with full traceability between the requirements derived from the ISO C language definition and the individual library tests. It is designed to support the qualification of implementations of the C standard library for safety-critical applications, both for third-party (COTS) and for self-developed or maintained C library implementations.
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Burn-In Test Sockets
The selection of the test socket is critical to the performance of a device during qualification testing where electrical bias and signals are applied. Key factors such as mechanical compatibility, operating temperature, ability to withstand high moisture levels, signal speed and lead inductance/capacitance all need to be taken into account when selecting the best socket for the test application.
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Weld Testing
Supports industries such as Aerospace, Nuclear, Automotive, Commercial Fabrication etc.Welding procedure consultancy and approvalWelder qualification test and codingWelding procedure certificationWelder performance qualificationOn site welding invigilationOffers a complete range of destructive and non-destructive testing facilities.Responsible Welding Co-ordinators available for customer supportCAA Weld Specimen SignatoriesCSWIP Approved Inspectors
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HDMI/DVI Transmitters
HDMI® transmitters and DVI transmitters remain in high demand in many professional, consumer, and automotive video applications. Analog Devices’ diverse solutions offer competitive advantages such as automotive qualification, low power, and small packages (3.4 mm × 3.4 mm WLCSP). Our range of HDMI/DVI transmitters provide conversion of a range of formats such as HDMI, MIPI, and TTL to HDMI video data. Typical applications include set-top boxes, video distribution, and digital cameras. In these applications, Analog Devices’ HDMI transmitters and DVI transmitters offer proven interoperability over years of implementation into many products. Our HDMI parts also support HDCP for encrypted content protection.
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Advanced Ethernet Tester
LinkRunner® 10G
Quickly test, verify, and troubleshoot 1Gig, Multi-Gig and 10Gig Ethernet (copper, fiber) including line-rate performance testing and packet captureLayer 1-7 AutoTest enables any technician to find network problemsMonitor networks for intermittent issues, every minute for up to 24 hours AllyCare-enables in-depth network discovery features and web remote controlLANBERT™ Media Qualification app tests the capability of premise cabling and media components for carrying Multi-Gig and 10Gig EthernetTwo LinkRunner 10G units can be used for line-rate performance testing to verify network capacity, performance and QoS, as well as service provider SLAs between sites
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Qualification Tester
LQ404
Computer Gesteuerte Systeme GmbH
The qualification tester LQ402 is designed to support up to 12 DUTs (Device under Test), for which the loads are installed in separate load boxes. The system consists out of 3 cabinets. One is for the electronic components with the primary measurement devices and the other two hold the 12 load boxes.
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Custom Assembly, Packaging and Qualification
DPACI specializes in providing Turn-Key Solutions. We offer comprehensive manufacturing, assembly, qualification, testing, and certification of high reliability EEE components. We have a dedicated, self-contained Class 10,000 clean room with Class 100 laminar flows certified to QML Q (Military) and V (Space) levels to perform all assembly operations from wafer processing to final hermetic package seal
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Substrate Manufacturing
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Qualification Tester
CableIQ
CableIQ qualification tester is the first cabling bandwidth tester for network technicians. This Ethernet network cable testergives even the most novice tech the vision to see what speeds existing cabling can support, quickly isolate cabling from network problems, and discover what is at the far end of any cable.
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Evaporative Emissions Testing
GASERA ONE SHED
Evaporative losses from the fuel system are tested for vehicle certification. GASERA ONE SHED allows direct monitoring of evaporative emissions as part of the qualification testing procedures for vehicles. The GASERA ONE SHED’s photoacoustic technique is approved by the Environmental Protection Agency (EPA) and the California Air Resources Board (CARB).
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VDATS, Cable Assembly Kit, All-Inclusive
541139193
VDATS, Cable Assembly Kit, All-InclusiveTop-Level part number for VDATS cable assembly kit that includes 26 individual cable assembly part numbers and a quantity of 35 total cable assemblies. Requires special order qualification.
