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- Pickering Interfaces Inc.
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PXI Programmable Resistor Card 2-Channel 3 Ohm to 32.7k Ohm
40-294-032
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Design for Test Service
Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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Triple Output Power Supply
U8030 Series
The Keysight U8030 Series variable DC power supply has a total output of 375 W—making this solution an ideal power source in the design and manufacturing of electronic devices. The U8030 Series power supplies feature an output sequencing capability for semiautomated tests. These power supplies enable you to generate output sequences with minimal programming skills. This solution features excellent load regulation and clean output noise for continued stability.
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LanCaster
4402700
Indicates all common wiring faults including split pairs Shows which end the installed link contains the fault Cable Length Meter, Tone Generator & Service Indicator Instant digital display gives unambiguous fault indication Rugged Palm-Top design weighs less than 350g (12oz) Complete with 1 Active Remote unit and test leads Up to 16 unique Active Remote units / Office Identifiers
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PCI Programmable Resistor Card 2-Channel 2.5 Ohm To 4.09k Ohm
50-294-023
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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VB-8034, 4-Channel, 350 MHz Bandwidth VirtualBench All-in-One Instrument
784343-12
4-Channel, 350 MHz Bandwidth VirtualBench All-in-One Instrument—The VB‑8034 combines a four‑channel, 350 MHz mixed-signal oscilloscope with protocol analysis, an arbitrary waveform generator, a digital multimeter, a programmable DC power supply, and digital I/O into a single device that integrates with your PC or iPad. The VirtualBench all‑in‑one instrument is simple and convenient and results in more efficient circuit design, debugging, and validation. The included software provides an interactive way to view all your measurements on a single screen and can be updated for free with software releases over time to continually add functionality and value to your VirtualBench. VirtualBench also tightly integrates with LabVIEW software to enable programmatic control and automated test sequences.
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PXI Programmable Resistor Card 2-Channel 3 Ohm to 65.5k Ohm
40-294-033
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Manual Test Solution
Titan
Grund Technical Solutions, Inc.
Titan is an easy to use, low cost Human Body Model (HBM) or Machine Model (MM) manual test solution. It can be used for design, engineering, and characterization of your devices. Ranging from 50 V to 16,000 V the Titan will have the largest voltage range of any HBM tester.
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PXI Multifunction I/O Module
The PXI Multifunction I/O Module provides I/O with varying numbers of channels, sample rates, and output rates with precise timing, triggering, and synchronization between models. This module can be used for industry applications such as laboratory research, design verification test, and manufacturing test.The PXI Multifunction I/O Module includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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Protocol Exerciser
Summit Z416
The Summit Z416 is a PCIe 4.0 protocol traffic generation test tool used for critical test and verification intended to assist engineers in developing and improving the reliability of their systems. The Summit Z416 can emulate PCI Express 4.0 root complexes or device endpoints, allowing new designs to be tested against corner case issues.
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Power Performance Test
The performance index of power product is decide the product quality, so it is very important to accurately test performance index in every stage to make sure that the product performance is conform to design index. Energy efficiency index includes power factor, input power, input voltage and etc.
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Mixers
Teledyne Microwave Solutions (TMS) offer a wide range of both double & triple balanced mixers for many different applications from commercial test equipment to space qualified units. Low conversion loss and wide bandwidths are the hallmark of the product line. The incorporation of Schottky diodes on some designs offers significant performance benefits.
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PXI Programmable Resistor Card 2-Channel 2.5 Ohm to 4.09k Ohm - SPST
40-294-123
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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High Power Programmable AC Source With Transients
Chroma Systems Solutions, Inc.
Ideal for commercial, power electronics, avionics, military, and regulation test applications from bench-top R/D design verification to quality assurance and mass production
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High Performance Chipscale Test Sockets
SC
Ardent Concepts Test Sockets for ATE test deploy patented SC Contact Sets. This technology is capable of over 2 Million mechanical insertions in production environments and uses easy to replace pins with no complicated assembly procedure. It is designed to be drop-in compatible with 1mm offset and straight through footprints to ease implementation, and RC SC’s simple and robust design is extremely cost effective when compared with existing “roll” type test contactors and sockets. Designed specifically for JEDEC QFN and MLF applications, SC High Performance Test Sockets are available for most handler set-ups and offer exceptional AC performance.
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Dynamically Controlled High Speed Digital I/O PXI Card
GX5280 Series
The GX5280 Series are high performance, cost-effective 3U PXI dynamic digital I/O boards with 32 TTL input or output channels and 32 LVDS input or output channels. The GX5280 Series offers an industry leading 512 MB of on-board memory and supports test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.
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AXIe Logic Analysis & Protocol Test
Keysight's AXIe Modular Logic Analysis and Protocol test modules and powerful analysis software provide essential capabilities for engineers working on fast digital designs and chipsets using high speed parallel and serial buses, such as DDR and PCI Express Gen 3.
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I3C Protocol Analyzer and Exerciser
PGY-I3C-EX-PD
Prodigy Technovations Pvt. Ltd.
I3C Protocol Analyzer (PGY-I3C-EX-PD) is the Protocol Analyzer with multiple features to capture and debug communication between host and design under test. I3C Serial bus interface is emerging as a chosen interface for all future sensor connectivity in mobile phone and automotive Industry. This could also be chosen for low cost, reliable interface for future embedded electronic applications to address the new data intensive applications.
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CMP Mechanical Kits (230x135mm)
230199 – CMP-240-HP
The CMP Mechanical kits are an excellent option for manual tests of both low and high volumes. Now in a more rigid design with removable probe plate for easier maintenance. Integrated fixture down switch as an option. The kit is available in 4 standard sizes but can be adjusted to your demands.
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High Temperature, Low Strain, Extended Performance Capacitive Extensometers
Model 7650A
Jinan Testing Equipment IE Corporation
Model 7650A extensometers measure strains with extremely high precision due to their design features and low strain range. All models are capable of tension and compression strain measurement, and may be used for fatigue testing under fully reversed load and strain conditions at frequencies up to 10 Hz.All 7650A models mount rigidly on the load frame and incorporate slide mounting to bring the extensometer into contact with the specimen. The gauge length is set automatically before mounting on the test specimen, which allows for hot mounting after thermal equilibrium has been reached.These units are specifically designed to provide high accuracy, high resolution measurements and perform high temperature fatigue testing at the highest possible frequencies. They incorporate capacitive sensors for low operating force and include electronics with programmable filtering and multi-point linearization for improved performance and accuracy. The overall design minimizes, and in many cases virtually eliminates, any influence from common lab environment vibrations.These water-cooled extensometers are equipped with high purity alumina rods for specimen contact when testing to 1200℃ (2200°F). Silicon carbide rods are used for the 1600℃ (2900°F) high temperature option.The Model 7650A is often customized for specific test needs. Contact Epsilon for a configuration that matches your requirement.
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RSE Wireless EMC Spurious Emission
TS8996
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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PXI-6232, 16 AI (16-Bit, 250 kS/s), 2 AO, 6 DI, 4 Sourcing DO, Bank-Isolated, PXI Multifunction I/O Module
779618-01
16 AI (16-Bit, 250 kS/s), 2 AO, 6 DI, 4 Sourcing DO, Bank-Isolated, PXI Multifunction I/O Module—The PXI‑6232 is a bank-isolated DAQ device designed for voltage I/O. It offers analog I/O, digital input, sourcing digital output, two 32‑bit counters, and digital triggering. The digital input and outputs are compatible with 24 V signals. It combines the safety and performance benefits of isolation with high-performance timing, amplification, and calibration technologies to offer accurate measurements and precise control. The PXI‑6232 is ideal for test, measurement, control, and design applications in environments with high voltages and electrical noise. You can use the PXI‑6232 to read from encoders, flow meters, and proximity sensors as well as control valves, pumps, and relays.
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Dummy Test Wafers/Chips
Advanced Dummy Test Wafers/Chips available with over 35 different chip designs and choices of 11 different material configurations as well as kits complete with test vehicles. Custom-make test production of TEG wafer/glass (TEG=Test Element Group). Design and provide custom-make test kit.
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PCI Resistor Card 2-Channel 1.5 Ohm To 4.09k Ohm With SPDT
50-293-123
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI-6239, 8 AI (16-Bit, 250 kS/s), 2 AO, 6 DI, 4 Sinking DO, Bank-Isolated, PXI Multifunction I/O Module
779626-01
8 AI (16-Bit, 250 kS/s), 2 AO, 6 DI, 4 Sinking DO, Bank-Isolated, PXI Multifunction I/O Module—The PXI‑6239 is a bank-isolated DAQ device designed for current I/O. It offers analog I/O, digital input, sinking digital output, two 32‑bit counters, and digital triggering. The digital input and outputs are compatible with 24 V signals. It combines the safety and performance benefits of isolation with high-performance timing, amplification, and calibration technologies to offer accurate measurements and precise control. The PXI‑6239 is ideal for test, measurement, control, and design applications in environments with high voltages and electrical noise. You can use the PXI‑6239 to read from encoders, flow meters, and proximity sensors as well as control valves, pumps, and relays.
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Complete IP Module
Scan Ring Linker SRL
The Scan Ring Linker SRLTM - is a complete IP module that can be easily embedded into a CPLD, FPGA or ASIC on a PCB to reduce the complexities and costs of designing 1149.1 (JTAG) test infrastructure for designs that use multiple scan rings. The SRL IP module links any number of scan rings (secondary scan paths) into a single high-speed test bus, which permits devices on secondary scan chains to be independently tested and configured through a single 1149.1 external interface.
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Variable Frequency Series Resonance Test Device
WABP
Wuhan Sangao Electrical Test Installations Limit Co.
The device mainly AC voltage withstand test design for 10kV, 35kV, 110kV, 220kV, substation and line of all electric main equipment.Reactor with multiple separate design, Not only can meet the requirements of equipment testing conditions high voltage, small current, and can meet the requirements of low voltage AC voltage withstand test, has a wider scope of application.The device is mainly composed of variable frequency control power supply, transformer, reactor, capacitor divider.
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Voltage/Continuity Tester
VOT-52
Standard Electric Works Co., Ltd
● Voltage test: 12V to 1000V AC/DC (8 LEDs) with indication by buzzer.● Voltage range: 12V, 24V, 50V, 120V, 230V, 400V, 750V, 1000V.● Test leads positioned at 19mm apart.● Interchangeable probe tip for 2mm and 4mm.● Polarity test : LED +/-● Audible continuity test.● Phase rotation test : /● Self-test button to ensure proper function of the device prior to testing.● Waterproof design, protection class: IP65.● Phase / Neutral identification.● Rubberized double-molded housing.● ELCB / RCD trip test.● Flashlight function.● Safety standard : IEC/EN 61010-1 III 1000V IEC/EN 61010-1 IV 600V IEC/EN 61243-3 EN 61326-1
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Digital Multimeters
*5½-digit resolution to 8½-digit resolution DMMs*6ppm basic voltage measurement accuracy on the 8½-digit DMM for calibration laboratories*Fast, 1 Msample/s sampling speed to capture complex, low level current profiles from IoT devices or other wireless devices*Sensitivity of 1 µΩ and 1 pA to test low power devices for research, design, and manufacturing test*A wide range of measurement functions such as DC and AC volts, DC and AC current, two- and four-wire Ohms, continuity, frequency, period, RTD, thermistor, and thermocouple temperatures, diode test, and capacitance*Numerous interface options including LAN/LXI, USB-TMC, GPIB, and RS-232 for data acquisition and automated testing*Intelligence to execute tests and create customized measurements with minimal PC interaction*Measurement expansion up to ten channels
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5G Channel Sounding, Reference Solution
The 5G Channel Sounding, Reference Solution is a combination of hardware, software, and measurement expertise providing the essential components to accelerate 5G sounding research. This reference solution enables researchers and design engineers to use, enhance, or modify the test platform as required to meet specific test application needs including scalable channel count, flexibility to transmit and measure in mmWave frequencies, wide transmit and analysis bandwidths, and real-time data processing.
