Applied Image, Inc.
APPLIED IMAGE Inc. is a world leader in the design and manufacture of precision-imaged optical components intended for a wide range of applications and industries that require NIST-traceable standards and/or precision-imaged components to test, calibrate, align, control or measure their optical or photonics systems. In addition to its large catalog of standard products, APPLIED IMAGE specializes in designing and manufacturing custom components, imaged to the strictest tolerances. Its mission is to provide the highest-quality products and customer service to consistently meet and exceed the expectations of its customers such as NASA (Mars Rover) and Goddard (International Space Station).
- (585) 482-0300
- (585) 288-5989
- info@appliedimage.com
- 1653 East Main Street
Rochester, NY 14609
United States
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SINE M-19 Sinusoidal Array
The Sinusoidal Array SINE M-19 is a remarkable new test array that achieves 256 cycles per mm while maintaining a significant modulation. It is designed for testing high resolution optical systems such as microscopes. Because its maximum width is 7.5mm, the SINE M-19 is small enough to fit easily onto a standard microscope slide (the TM-G variation is mounted in glass).
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Reticles, Optical Slits, Optical Apertures
With over 30 years of experience in the manufacturing of high precision Reticles, Slits, Apertures, and Pinholes, APPLIED IMAGE has gained a reputation for delivering precise and accurate parts. We have supplied thousands of these parts to be used in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.
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IEEE Test Charts (Video /Cine)
IEEE Test Charts (Video /Cine) by Applied Image - IEEE Video Resolution Chart, Picture Height Test Chart, Microsoft WebCam Image Quality Test, OTTO-2 Otto Nemenz Cine Lens Calibration Reticle
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O.E.M. Optical Standards
O.E.M. Optical Standards by Applied Image - Boston Scientific Checkerboard Array, Cognex Glass Calibration Plate Set
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SINE M-7 Sinusoidal Array
The Sinusoidal Array SINE M-7 has an image size of 22mm x 30mm which makes it small enough to fit into a standard 35mm projection frame. The gray scale is contained in the outer rows. It is made on 35mm perforated film.The TM-G variations are produced on a wider film (without perforations) and cemented between glass. They are available at each modulation (-35, -60, -80).
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SINE M-13-60 Sinusoidal Array
The Sinusoidal Array SINE M-13-60 is designed to be used for evaluating systems that work in the reflective mode such as scanners, machine vision systems and cameras. It is imaged on Photo Paper in four different sizes getting larger from 1X – 8X. The ½X and 1X slides incorporate the same spatial frequencies. Spatial frequencies for the 2X, 4X and 8X versions are 1/2, 1/4 and 1/8 respectively.
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SINE M-15-60 Sinusoidal Array
The reflective Sinusoidal Array SINE M-15-60 is similar to the M-13-60 (1X version) except that the range of spatial frequencies begins with 0.25 cycles per mm and extends to 20 cycles per mm. To compensate for the additional frequencies, the 3/16 cycles per mm area has been eliminated. Both arrays are imaged on Photo Paper.
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ACCUplace Dot Patterns
AP-D Series
All machine vision lenses will show some type of distortion. Minimizing or correcting that distortion is crucial in most applications. The ACCUplace Dot Patterns target is designed to check, verify, or quantify barrel distortion in vision systems, alignment between multiple optical systems, and can calibrate instruments with both vision and motion systems. The indexed columns and rows of dot features provide reference points that make alignment and distortion detection simple and straightforward. The AP-D is offered on four standard materials; Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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Conformance Calibration Standard Test Card for GS1-DataBar Symbol Verifiers
AI-CCS-DATABAR
This test card is ideal for testing verifiers, scanners, and other GS1-DataBar barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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Conformance Calibration Standard Test Card for GS1-128 Symbol Verifiers
AI-CCS-128-E Rev B
This test card is ideal for testing of verifiers, scanners, and other GS1-128 barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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Image Analysis Micrometers
For calibrating and analyzing microscopy measurement systems, the IAM line of Image Analysis Micrometers are perfectly suited. Calibrated to NIST Standards, and imaged with the best line edge quality in the industry, the IAM series is a diversified line of slides that function in areas of color calibration (IAM-9C), Optical Magnification, Frame Distortion, and other applications. Custom features, substrates, sizes and designs are available as custom solutions.
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ACCUplace Grid Indexing Pattern
AP-G Series
Ensuring precise motion and positional accuracy is critical for a number of video analysis systems and automated measuring instruments. The AP-G series is ideally suited for calibrating such elements, in addition to its uses in determining stage squareness, and travel distance image analysis and visual inspection systems where precise motion must be calibrated and measured. All AP-G targets have number/letter indexed columns and rows for easy calibration and are offered on four standard materials; Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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ACCUplace Dot Distortion Target
AP-DD Series
All machine vision lenses will show some type of distortion. Minimizing or correcting that distortion is crucial in most applications. The ACCUplace Dot Distortion target is designed to detect the presence of both barrel/pincushion distortion as well as alignment distortion that causes the keystone effect. The precise amount of distortion is determined from an array of precisely placed dots in a regular array. The results can be used to correct for any distortion that occurs within the optical system. The AP-DD is offered on three standard substrates; Chrome on Glass (CG) Opal (OP) and Photo Paper (RM).
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Conformance Calibration Standard Test Card for UPC/EAN Symbol Verifiers
AI-CCS-UPC/EAN-E Rev S
For those who prefer a traditional vertical format calibration test card, APPLIED IMAGE offers our new Conformance Calibration Standard Enhanced for UPC/EAN Bar Code Symbol Verifiers. The new standard complies with both the ANSI X3.182 and ISO 15416 standards and is ideal for testing of verifiers, scanners, and other UPC bar reading equipment as well as a tool for training new operators to assure proper “methodology' in the use of verifiers.
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ACCUplace Macro Calibration Standard
AP-M Series
With both X & Y axis metric scales, these dual axis targets are ideal for calibrating optical magnification in microscopes, linear distance, stage motion and squareness. In addition, with the larger area calibration scale, the calibration of low power optical systems over the longer distances can be easily carried out. The AP-M is offered on two standard materials; Glass (CG) and Opal (OP).
